Metrology for analog module testing using analog testability bus
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Alternative test methods using IEEE 1149.4
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Intrinsic response for analog module testing using an analog testability bus
ACM Transactions on Design Automation of Electronic Systems (TODAES)
IEEE Std 1149.1: Where Are We? Where From Here?
IEEE Design & Test
Design for Testability in Hardware-Software Systems
IEEE Design & Test
A D&T Special Report: P1149.4 Mixed-Signal Test Bus
IEEE Design & Test
Analog DFT Using an Undersampling Technique
IEEE Design & Test
Limited access testing: IEEE 1149.4-instrumentation and methods
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Reconfigurable data converter as a building block for mixed-signal test
EDTC '97 Proceedings of the 1997 European conference on Design and Test
IEEE P1149.4 - ALMOST A STANDARD
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Design, Fabrication and Use of Mixed-Signal IC Testability Structures
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IMPLEMENTATION OF MIXED CURRENT/VOLTAGE TESTING USING THE IEEE P1149.4 INFRASTRUCTURE
ITC '97 Proceedings of the 1997 IEEE International Test Conference
desire to reduce (or eliminate) complex and in P1149.4 Environment
ITC '97 Proceedings of the 1997 IEEE International Test Conference
The Integration of Boundary-Scan Test Methods to A Mixed-Signal Environment
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Embedded System Level Self-Test for Mixed-Signal IO Verification
Journal of Electronic Testing: Theory and Applications
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment
Journal of Electronic Testing: Theory and Applications
Methods of Testing Discrete Semiconductors in the 1149.4 Environment
Journal of Electronic Testing: Theory and Applications
Block-level Bayesian diagnosis of analogue electronic circuits
Proceedings of the Conference on Design, Automation and Test in Europe
Structure and metrology for a single-wire analog testability bus
ITC'94 Proceedings of the 1994 international conference on Test
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