Alternative test methods using IEEE 1149.4

The P1149.4 Mixed Signal Test Bus: Costs and Benefits

Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test

Implementation of Mixed Current/Voltage Testing Using the IEEE P1149.4 Infrastructure

Proceedings of the IEEE International Test Conference

IEEE P1149.4-Almost a Standard

Proceedings of the IEEE International Test Conference

Design, Fabrications and Use of Mixed-Signal IC Testability Structures

Proceedings of the IEEE International Test Conference

Parasitic Effect Removal for Analog Measurement in P1149.4 Environment

Proceedings of the IEEE International Test Conference

Limited access testing: IEEE 1149.4-instrumentation and methods

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Structure and Metrology for an Analog Testability Bus

Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them

Towards a Test Standard for Board and System Level Mixed-Signal Interconnects

Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them

Testing analog and mixed-signal integrated circuits using oscillation-test method

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems