Alternative test methods using IEEE 1149.4
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Journal of Electronic Testing: Theory and Applications
Limited access testing: IEEE 1149.4-instrumentation and methods
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A general purpose 1149.4 IC with HF analog test capabilities
Proceedings of the IEEE International Test Conference 2001
IOLTS '04 Proceedings of the International On-Line Testing Symposium, 10th IEEE
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This paper presents an innovative application of IEEE1149.4 and the Integrated Diagnostic Reconfiguration (IDR) method to an Automotive Electronic Control Unit implemented as a fully-integrated mixed-signal system. The IEEE1149.4 test structure has been embedded and used on-line for interconnect monitoring and signal analysis. This provides higher resolution failure diagnostics enabling localised fault compensation. A novel On-Line Monitoring architecture is presented, that supports real-time testing of the critical circuit nodes. The paper concludes that fault tolerance can be integrated into mixed-signal electronic systems to handle key failure modes.