IEEE P1149.4-Almost a Standard

Alternative test methods using IEEE 1149.4

DATE '00 Proceedings of the conference on Design, automation and test in Europe

Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test

IEEE Design & Test

The Integration of Boundary-Scan Test Methods to A Mixed-Signal Environment

ITC '99 Proceedings of the 1999 IEEE International Test Conference

TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers

Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design

Test infrastructure design for mixed-signal SOCs with wrapped analog cores

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability