The Integration of On-Line Monitoring and Reconfiguration Functions using IEEE1149.4 Into a Safety Critical Automotive Electronic Control Unit

Authors:
C. Jeffrey;R. Cutajar;S. Prosser;M. Lickess;A. Richardson;S. Riches
Affiliations:
Lancaster University, UK;Lancaster University, UK;TRW Automotive, UK;TRW Automotive, UK;Lancaster University, UK;Micro Circuit Engineering, UK
Venue:
Proceedings of the conference on Design, Automation and Test in Europe - Volume 3
Year:
2005

Citing 5
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Abstract

This paper presents an innovative application of IEEE 1149.4 and the Integrated Diagnostic Reconfiguration (IDR) as tools for the implementation of an embedded test solution for an Automotive Electronic Control Unit implemented as a fully integrated mixed signal system. The paper described how the test architecture can be used for fault avoidance with results from a hardware prototype presented. The paper concludes that fault avoidance can be integrated into mixed signal electronic systems to handle key failure modes.