Reconfigurable data converter as a building block for mixed-signal test

Authors:
E. K. F. Lee
Affiliations:
Dept. of Electrical and Computer Engineering, Iowa State University, Ames, Iowa
Venue:
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Year:
1997

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Abstract

A reconfigurable data converter (RDC) that can be configured to a number of ADCs and DACs having different speeds and resolutions for testing mixed-signal systems is proposed. It can be used as a building block in mixed-signal boundary scan or built-in self-test (BIST) techniques. The RDC can also be configured as random noise generators and used as test stimuli in BIST. Since the required area of the proposed RDC is only slightly larger than that of a conventional pipelined ADC, it can be used in many mixed-signal systems.