New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters
Journal of Electronic Testing: Theory and Applications
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Test Metrics for Analog Parametric Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
On the Detectability of Parametric Faults in Analog Circuits
ICCD '02 Proceedings of the 2002 IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD'02)
Concurrent transient fault simulation for analog circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A comprehensive signature analysis scheme for oscillation-test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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A design for test (DFT) hardware is proposed to increase the controllability of a thermometer coded current steering digital to analog converter. A procedure is introduced to reduce the diagnosis and structural test time from quadratic to linear using the proposed DFT hardware. To evaluate the applicability of the proposed technique, principal component analysis is used to create virtual process variations to simulate in lieu of semiconductor fabrication data. An architecture specific soft fault model is suggested for the diagnosis problem. Random errors according to the fault model are introduced in the virtual test environment on top of the process variations and it is shown that diagnosis of a fault is possible with high accuracy with the proposed method. The same technique employing principal component analysis is furthermore used to provide process variation-aware reference test comparison values for a structural test of the DAC. The structural test provides a mechanism to test for even unmodeled manufacturing faults. The process variation-aware test values help detect defects even under process variations. The proposed DFT hardware and method are low cost and quite suitable for a built-in self diagnosis and test implementation.