Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling

Authors:
Eric Felt;Stefano Zanella;Carlo Guardiani;Alberto Sangiovanni-Vincentelli
Affiliations:
Electrical Engineering and Computer Sciences, University of California, Berkeley, Berkeley, California;Elettronica ed Informatica, Università degli Studi di Padova, Padova, Italy;Central R&D D.A.I.S., SGS-Thomson Microelectronics, Agrate Brianza, Italy;Electrical Engineering and Computer Sciences, University of California, Berkeley, Berkeley, California
Venue:
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Year:
1997

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Abstract

A methodology for hierarchical statistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principal component analysis, response surface methodology, and statistics to directly calculate the statistical distributions of higher-level parameters from the distributions of lower-level parameters. We have used the methodology to characterize a folded cascode operational amplifier and a phase-locked loop. This methodology permits the statistical characterization of large analog and mixed-signal systems, many of which are extremely time-consuming or impossible to characterize using existing methods.