Empirical model-building and response surface
Empirical model-building and response surface
Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Fast statistical analysis of process variation effects using accurate PLL behavioral models
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Behavior-level yield enhancement approach for large-scaled analog circuits
Proceedings of the 47th Design Automation Conference
A fast heuristic approach for parametric yield enhancement of analog designs
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on verification challenges in the concurrent world
Efficient trimmed-sample Monte Carlo methodology and yield-aware design flow for analog circuits
Proceedings of the 49th Annual Design Automation Conference
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