Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Generalized constraint generation for analog circuit design
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Proceedings of the 37th Annual Design Automation Conference
Proceedings of the 38th annual Design Automation Conference
Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits
A layout-aware synthesis methodology for RF circuits
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Proceedings of the conference on Design, automation and test in Europe: Proceedings
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This paper describes a scalable method (called ALAMO) for modeling analog circuit performance in the presence of MOSFET process parameter variations, including (i) process/model parameter variation of individual devices and (ii) mismatch of process/model parameters of device pairs. This capability is very important for many popular analog circuits, such as current biasing circuits, voltage reference circuits, single-ended output amplifiers, and transconductance amplifiers. The methodology uses two steps, layout regularity analysis (LRA) and principal equation analysis (PEA), to reduce the complexity of the modeling problem. LRA finds devices and device pairs with similar statistical behavior. PEA eliminates less important correlations using a sensitivity-based metric. Experiments showed that ALAMO method is more accurate than Monte Carlo analysis and @s-space method, and scales well even for analog circuits involving hundreds of fingered MOSFETs. LRA and PEA are effective in decreasing the modeling problem complexity reducing the modeling time by more than 70% without significantly influencing accuracy.