A method to diagnose faults in linear analog circuits using an adaptive tester
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Parametric fault diagnosis for analog systems using functional mapping
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Digital Signature Proposal for Mixed-Signal Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
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We propose a method of diagnosing analog circuits that is achieved by combining an operation-region model and an X---Y zoning method. The X---Y zoning method can be used to detect faults in analog circuits by using the relationship between circuit inputs and outputs. The operation-region model can be used to analyze/model circuit behaviors by utilizing changes in the operation regions of MOS transistors in a circuit. Operation regions are obtained from transistor node voltages at sampling time corresponding to a particular excitation of the input value and the corresponding output value. Since we developed a data processing method to handle data discretely, we could implement a procedure for diagnosis based on the preset test, which is a method of diagnosing digital circuits. We demonstrated the effectiveness of our method by applying it to ITC'97 benchmark circuits with hard and soft faults. We found that the diagnostic resolution is one for every fault.