A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection

Authors:
Badar-Ud-Din Ahmed;Wang Youren;Rizwan Ullah;Najam-Ud-Din Ahmed
Affiliations:
Nanjing University of Aeronautics & Astronautics, Nanjing, China;Nanjing University of Aeronautics & Astronautics, Nanjing, China;Nanjing University of Aeronautics & Astronautics, Nanjing, China;Institute of Space Technology, Islamabad, Pakistan
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2012

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Abstract

Technique for Order preference by Similarity to Ideal Solution (TOPSIS) is a Multi Attribute Decision Making (MADM) technique employed in diverse disciplines for the prioritization of alternative options/solutions to a problem. Test vector compaction for analog fault detection is a field which is witnessing continuous growth and experimentation. This study suggests a novel TOPSIS-based approach for the compaction of analog test vector to be constituted from test signals achieved by an exhaustive search method. The compacted test vector can help to reduce the test costs while at the same time enabling the test designer to base the compaction methodology on objectively obtained deterministic data.