Adaptation in natural and artificial systems
Adaptation in natural and artificial systems
Fault Models and Test Generation for OpAmp Circuits—The FFM
Journal of Electronic Testing: Theory and Applications
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Chromosome Representation through Adjacency Matrix in Evolutionary Circuits Synthesis
EH '02 Proceedings of the 2002 NASA/DoD Conference on Evolvable Hardware (EH'02)
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
A circuit representation technique for automated circuit design
IEEE Transactions on Evolutionary Computation
Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection
Journal of Electronic Testing: Theory and Applications
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