Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations

Authors:
José Vicente Calvano;Vladimir Castro Alves;Marcelo Lubaszewski
Affiliations:
-;-;-
Venue:
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Year:
2000

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Abstract

This work proposes a new BIST scheme for 2nd order Butterworth, Chebyshev and Bessel filter approximations, using the transient analysis of simple input test vectors. A functional approach for fault modeling in 2nd order filters is presented and the Transient Response Method is used for fault detection. The approach considers the filter as a 2nd order dynamic system where wc and Qp deviations are faults to be detected. The peak time is the observed parameter that is evaluated in order to verify the filter correctness. The obtained results are very promising since all of wc and Qp deviations as well as 100% of passive components are detected for this BIST scheme