Modern control engineering (3rd ed.)
Modern control engineering (3rd ed.)
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
TESTING THE CONFIGURABLE ANALOG BLOCKS OF FIELD PROGRAMMABLE ANALOG ARRAYS
ITC '04 Proceedings of the International Test Conference on International Test Conference
On-line Testing Field Programmable Analog Array Circuits
ITC '04 Proceedings of the International Test Conference on International Test Conference
Fault detection in systems with 2nd order dynamics using transient analysis
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
An adaptive amplifier system for wireless sensor network applications
Journal of Electrical and Computer Engineering
A low-cost configurability test strategy for an embedded analog circuit
Microelectronics Journal
| Hi-index | 0.00 |
In this work a strategy for testing analog networks, known as Transient Response Analysis Method, is applied to test the Configurable Analog Blocks (CABs) of Field Programmable Analog Arrays (FPAAs). In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks to known input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between fault-free and faulty CABs. Two FPAAs from different manufacturers and distinct architectures are considered as CUT. For one of the devices there is no detailed information about its structural implementation. For this reason, a functional fault model based on high-level parameters of the transfer function of the programmed blocks is adopted, and then, the relationship between these parameters and CAB component deviations is investigated. The other considered device allows a structural programming in which the designer can directly modify the values of programmable components. This way, faults can be injected by modifying the values of these components in order to emulate a defective behavior. Therefore, it is possible to estimate the fault coverage and test application time of the proposed functional test method when applied to both considered devices.