Fault detection in systems with 2nd order dynamics using transient analysis

Authors:
José Vicente Calvano;Vladimir Castro Alves;Marcelo Lubaszewski
Affiliations:
COPPE, UFRJ and Brazilian Navy Research Institute, Rio de Janeiro, Brazil;DELET, UFRGS and PEE, COPPE, UFRJ, Rio de Janeiro, Brazil;DELET, UFRGS, Porto Alegre, Brazil
Venue:
SBCCI'99 Proceedings of the XIIth conference on Integrated circuits and systems design
Year:
1999

Citing 2
Cited 1

Functional Fault Models for Analog Circuits

IEEE Design & Test
Analogue Fault Modelling and Simulation for Supply Current Monitoring

EDTC '96 Proceedings of the 1996 European conference on Design and Test

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

This work proposes a transient analysis method for fault detection in systems with 2nd order dynamics using a functional fault model. The approach consider the system pole-zero configuration as its main characteristic and its correspondence with the peak time and the system overshoot is used in order to detect the faults. The input stimuli is a compact test vector which consists of a step, ramp or parabola. The results show that for this sort of circuits 100% of faults can be detected.