High-level synthesis: introduction to chip and system design
High-level synthesis: introduction to chip and system design
The Simple Genetic Algorithm: Foundations and Theory
The Simple Genetic Algorithm: Foundations and Theory
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
TASTE: a tool for analog system testability evaluation
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Anaconda: simulation-based synthesis of analog circuits via stochastic pattern search
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Developing web applications in a mobile computing environment
ACOS'06 Proceedings of the 5th WSEAS international conference on Applied computer science
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With increasing uncertainties in the modeling and processing of semiconductor devices, it is essential that the sources of failures be identified once the devices are manufactured. We present a methodology to diagnose the problems in broadband amplifiers by determining the most important small signal parameters of the internal transistors. We use an evolutionary algorithm specifically designed to mimic the expected errors to ensure fast convergence to the correct solution. Sensitivity analysis is used to determine the set of the most impactful small signal parameters and to guide the evolutionary search. Experimental results indicate the proposed algorithm determines the parameters accurately and it scales well in terms of accuracy and computation time.