Fault diagnosis of analog circuits based on machine learning
Proceedings of the Conference on Design, Automation and Test in Europe
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting
Journal of Electronic Testing: Theory and Applications
A test and calibration strategy for adjustable RF circuits
Analog Integrated Circuits and Signal Processing
Fault analysis and simulation of large scale industrial mixed-signal circuits
Proceedings of the Conference on Design, Automation and Test in Europe
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Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.