RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST)
IOLTS '05 Proceedings of the 11th IEEE International On-Line Testing Symposium
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
Verifying functional specifications by regression techniques on Lissajous test signatures
IEEE Transactions on Circuits and Systems Part I: Regular Papers
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A module to perform a built-in self-test in CMOS RF receivers is presented. The module is associated with a test strategy consisting of measuring the main performance parameters of the single building blocks individually. Circuitry overhead, however, is kept low by using some blocks as part of the test set-up and reusing them. The test overhead has also been reduced by replacing direct determination of performance parameters with their estimation. The test methodology has been applied to a mixer in the first down conversion stage of a GSM receiver, estimating its conversion gain, 1dB compression and third-order interception points. Using the output of the IF amplifier as the only testing point, the rms errors in the estimation of the above mentioned parameters are 1.5, 3.0 and 2.7%, respectively.