Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters

Authors:
Byoungho Kim;Hongjoong Shin;Ji Hwan (Paul) Chun;Jacob A. Abraham
Affiliations:
The University of Texas at Austin, USA;The University of Texas at Austin, USA;Intel Corporation, AZ, USA;The University of Texas at Austin, USA
Venue:
ETS '06 Proceedings of the Eleventh IEEE European Test Symposium
Year:
2006

Citing 0
Cited 1

Verifying functional specifications by regression techniques on Lissajous test signatures

IEEE Transactions on Circuits and Systems Part I: Regular Papers

Quantified Score

Hi-index	0.00

Visualization

Abstract

Most scan based designs implement the scan enable as a slow speed global control signal, and can therefore only implement launch-on-capture (LOC) delay tests. Launch-onshift (LOS) tests are generally more effective, achieving higher fault coverage with ...