Wireless OFDM Systems: How to Make Them Work?
Wireless OFDM Systems: How to Make Them Work?
Mixed Loopback BiST for RF Digital Transceivers
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Low-Cost Production Testing of Wireless Transmitters
VLSID '06 Proceedings of the 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
Prediction of analog performance parameters using fast transient testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Beamforming in MISO systems: empirical results and EVM-based analysis
IEEE Transactions on Wireless Communications
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
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High-volume manufacturing of current generation orthogonal frequency division multiplexing (OFDM transceivers mandates testing for error-vector-magnitude (EVM) at production testing. During EVM test, a modulated RF input signal is down-converted and demodulated to obtain the output baseband digital data and EVM is computed by processing the baseband digital data. Hence, production testing of OFDM devices would require such modulation- and demodulation-capable automated test equipment (ATE) to perform EVM test. Such capabilities significantly add up to the cost of the ATE, thereby increasing the overall cost of testing. Moreover, test time for EVM can be relatively long compared to other tests due to the need to average over a large number of data bits. In this paper, we propose a methodology for testing EVM using multi-tone signals sourced from inexpensive signal sources that generate standard constellations. Moreover, introducing null carriers in the multi-tone test stimulus enables accurate characterization of system noise with reduced number of data bits. This enables significant speedup in EVM testing. We present the theory to corroborate the proposed approach along with simulation and hardware results. The proposed test method also has the potential to significantly reduce EVM test time under production test conditions.