Improving the testability of switched-capacitor filters
Journal of Electronic Testing: Theory and Applications - Joint special issue on analog and mixed-signal testing
Practical Oscillation-Based Test of Integrated Filters
IEEE Design & Test
Proceedings of the IEEE International Test Conference
TI-BIST: a temperature independent analog BIST for switched-capacitor filters
ATS '00 Proceedings of the 9th Asian Test Symposium
Test synthesis for DC test of switched-capacitors circuits
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Effective Oscillation-Based Test for application to a DTMF Filter Bank
ITC '99 Proceedings of the 1999 IEEE International Test Conference
All-Pass SC Biquad Reconfiguration Scheme for Oscillation Based Analog BIST
ETS '04 Proceedings of the European Test Symposium, Ninth IEEE
Oscillation-Based Test in Mixed-Signal Circuits (Frontiers in Electronic Testing)
Oscillation-Based Test in Mixed-Signal Circuits (Frontiers in Electronic Testing)
Testing analog and mixed-signal integrated circuits using oscillation-test method
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DFT for digital detection of analog parametric faults in SC filters
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper, we explore general conditions for the oscillation based test of switched-capacitor biquad filter stages. Expressions describing the characteristics of a filter stage put into oscillation are derived and conditions for achieving oscillation by internal transformation of the filter stage are explored. Reconfiguration scheme based on the transformation of the biquad filter stage to a quadratic oscillator is studied. Theoretically the circuit can be put into oscillation by de-activating a single capacitor. Simulations, however, show that in practice a carefully designed low feed-back loop is required to achieve acceptable oscillation test mode.