A Simple and Secure Start-Up Circuitry for Oscillation-Based-Test Application
Analog Integrated Circuits and Signal Processing
DfT and on-line test of high-performance data converters: a practical case
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
EXPERIMENTAL RESULTS FOR CURRENT-BASED ANALOG SCAN
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Digital-Compatible Testing Scheme for Operational Amplifier
Journal of Electronic Testing: Theory and Applications
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This paper focuses on the implementation of the 'sw-op amp' concept for analog circuits testing. Some alternative CMOS implementations are presented and compared in terms of influential parameters from a performance and cost point of view. Results show that the impact on the performance, power dissipation, and cost in terms of area and design efforts provoked by the use of sw-opamp structures, can be significantly reduced through efficient design of this cell.