DYNAMIC TESTING OF ADCS USING WAVELET TRANSFORMS

Authors:
Takahiro Yamaguchi;Mani Soma
Affiliations:
-;-
Venue:
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Year:
1997

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Abstract

This paper introduces a new method for evaluating non-idealitiesin ADCs using wavelet transforms. Compared withconventional testing methods, this method can shorten thetest time and improve test quality during production testingof ADCs.