An improved method of ADC jitter measurement

  • Authors:

  • Yves Langard;Jean-Luc Balat;Jacques Durand

  • Affiliations:

  • Thomson-CSF, SCTF, Orsay, France;Thomson-CSF, SCTF, Orsay, France;Thomson-CSF, SCTF, Orsay, France

  • Venue:
  • ITC'94 Proceedings of the 1994 international conference on Test
  • Year:
  • 1994

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Abstract

This paper describes an original and highly accurate method for measuring analog to digital converters jitter. Previous works cover the "locked" histogram test which is generally used to estimate aperture uncertainty. This new method uses substraction techniques in a dual-channel sampling system. Synthesizers phase noise, voltage noise and ADC non linearities are removed to give the sum of both ADC jitter. Then a third ADC is used to determine one ADC jitter value by 3 consecutive measurements. A significant improvement is demonstrated.