Adaptive signal processing
Discrete-time signal processing
Discrete-time signal processing
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP Calibration for Accurate Time Waveform Reconstruction
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Reduction of errors due to source and meter in the nonlinearity test
ITC '98 Proceedings of the 1998 IEEE International Test Conference
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Measuring distortion using sources and digitizers that are nonlinear presents a difficult testing problem. A novel test method using digital signal processing (DSP) techniques is presented to address the error of the digitizer. A Taylor series representation is used to model the distorted digitizer and the device under test (DUT). A set of simultaneous equations can be constructed by considering the frequency contents of the digitized signal. These simultaneous equations can be solved to eliminate the error of the digitizer and give the nonlinearity ofthe DUT by itself. Additive Gaussian noise is assumed when analyzing errors in computation and during data acquisition. Simulation and experimental results support the analysis.