Reduction of errors due to source and meter in the nonlinearity test

  • Authors:
  • Luke S. L. Hsieh

  • Affiliations:
  • -

  • Venue:
  • ITC '98 Proceedings of the 1998 IEEE International Test Conference
  • Year:
  • 1998

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Abstract

Nonlinearity test is required for manyproducts of various applications, such as in consumer,and is dtfjcult to test when sources and meters arenonlinear. A novel method using digital signalprocessing (DSP) techniques is presented to reducethe errors introduced by nonlinear source and meter.It uses the Taylor series representation to model thenonlinearity of source, meter, and device under test(DUT). The nonlinearity coeficients of the overallstages are distorted by the nonlinear source andmeter. These coeficients can be corrected by thenonlinearity coefJicients with the DUT bypassed;accordingly the errors introduced by the nonlinearsource and meter are minimized.