DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Improving DSP-Based Measurements with Spectral Interpolation
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Linearity Testing Issues of Analog to Digital Converters
ITC '99 Proceedings of the 1999 IEEE International Test Conference
RAMP TESTING OF ADC TRANSITION LEVELS USING FINITE RESOLUTION RAMPS
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters
Journal of Electronic Testing: Theory and Applications
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Measuring analog threshold voltage between twodifferent digital codes is a common test performed duringproduction testing of ADCs. Due to the noisy natureof analog signals, this test can take considerableamount of costly test time. This paper presents a fastalgorithm for measuring code edges of ADCs. In thismethod, a gaussian distribution is assumed for noise inADCs and the code edges are determined by interpolatingthe inverse cumulative distribution of the gaussianfunction. A fast testing method for guaranteeing thespecifications on offset and gain error is developed as acorollary to the code edge measuring technique. Practicalissues in implementing this technique in productiontesting are discussed. Production test results showexcellent repeatability and large saving in productiontest time.