RAMP TESTING OF ADC TRANSITION LEVELS USING FINITE RESOLUTION RAMPS

Authors:
Solomon Max
Affiliations:
-
Venue:
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Year:
2001

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Abstract

A common strategy for testing ADCs involves applying aramp waveform to the converter, collecting a histogram ofthe converter response, and computing the transitionlevels. High resolution converters require high resolutionsources with tight linearity to implement the test. Amethod is described which excites the ADC with animperfect ramp whose resolution is comparable to theADC noise. The transfer characteristics are extrapolatedfrom the resultant response. The method recovers thethreshold value with the same number of samples that arerequired by the classic ramp histogram.