Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters

Authors:
Richard Rosing;Hans Kerkhoff;Ronald Tangelder;Manoj Sachdev
Affiliations:
MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands. R.Rosing@lancaster.ac.uk;MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands. H.G.Kerkhoff@el.utwente.nl;MESA Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands. R.J.W.T.Tangelder@el.utwente.nl;Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands. msachdev@ece.uwaterloo.ca
Venue:
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Year:
1999

Citing 3
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Abstract

This paper describes a test method for analogue (partsof) ICs that determines whether an IC is good or not bymeasuring the currents flowing through its constituent circuits.The ICCQ test method is not a full functional test. Itis aimed primarily ...