TEST CHALLENGES FOR SONET/SDH PHYSICAL LAYER OC3 DEVICES AND BEYOND

  • Authors:

  • Udaya Natarajan

  • Affiliations:

  • -

  • Venue:
  • ITC '01 Proceedings of the 2001 IEEE International Test Conference
  • Year:
  • 2001

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Abstract

Testing SONET/SDH physical layer devices at andabove OC3 (optical carrier 3) / STS3(synchronous transportsignal 3) rates needs a new approach. Due to fastedge rates the spectral content of the signals is in theGHz range. High speed transceivers must have low voltagedifferential I/O to meet fast data transfer rates overlonger transmission lines. Such devices with high pincount and data rates above OC3/STS3 are sensitive topin to pin skew on the Automatic Test Equipment(ATE). Many factors have to be taken into account duringtest development phase to capture and test the abovesignal conditions. Transmission line effects are one ofthe key parameters to be accounted for load boarddesign. Test instrumentation and their limitations areanother important resource.