DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
Linearity Testing Issues of Analog to Digital Converters
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Hi-index | 0.00 |
The long and complex procedure to test ADCs constitutes an important issue in the context of mixed-signal testing. To lower the testing costs, we propose shorter but less selective test flows solely based on spectral analysis. This paper investigates the efficiency that can be achieved using this approach and studies the influence of the ADC specifications on the efficiency of the proposed dynamic-only test flows.