Colorimetric and photometric compensation for see-through displays

Authors:
Christian Weiland;Anne-Kathrin Braun;Wolfgang Heiden
Affiliations:
University of Applied Sciences Bonn-Rhein-Sieg, Germany;Fraunhofer Institute for Applied Information Technology, Germany;University of Applied Sciences Bonn-Rhein-Sieg, Germany
Venue:
ACM SIGGRAPH 2008 posters
Year:
2008

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Abstract