A novel technique for improving temperature independency of ring-ADC

Authors:
Shun Li;Hua Chen;Feng Zhou
Affiliations:
Fudan University, Shanghai, China;Fudan University, Shanghai, China;Fudan University, Shanghai, China
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2008

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Abstract

A new temperature compensation technique for ringoscillator-based ADC is proposed in this paper. It employs a novel fixed-number-based algorithm and a CTAT current biasing technology to compensate the temperature-dependent variations of the output, thus eliminates the need of digital calibrations. Simulation results prove that, with the proposed technique, the resolution under the temperature range of 0 °C to 100 °C can reach a 2-mV quantization bin size with an input voltage span of 120mV, at the sampling frequency fs=100KHz.