A Critique of Software Defect Prediction Models
IEEE Transactions on Software Engineering
Quantitative Analysis of Faults and Failures in a Complex Software System
IEEE Transactions on Software Engineering
A literature survey of the quality economics of defect-detection techniques
Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering
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The paper describes a mathematical model, the Exposure Model, for the prediction of customer reported defects in a large software system. In the model, exposure is defined as the likely fraction of the original defects in the software system that is reported by any customer, in any month and against any version of the system. The basic idea is to try to model exposure as the product of the isolated effects of a few customer- and system-characteristics. The model has been used for several purposes: to better understand defect detection mechanisms, and to better predict the resources required for defect correction. Also, the model has enabled us to make an early estimate of product quality, and thereby give valuable input for other important purposes.