Analysis of the reliability of a subset of change metrics for defect prediction

Authors:
Raimund Moser;Witold Pedrycz;Giancarlo Succi
Affiliations:
Free University of Bolzano-Bozen, Bolzano, Italy;University of Alberta, Edmonton, AB, Canada;Free University of Bolzano-Bozen, Bolzano, Italy
Venue:
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement
Year:
2008

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Abstract

In this paper, we describe an experiment, which analyzes the relative importance and stability of change metrics for predicting defects for 3 releases of the Eclipse project. The results indicate that out of 18 change metrics 3 metrics contain most information about software defects. Moreover, those 3 metrics remain stable across 3 releases of the Eclipse project. A comparative analysis with the full model shows that the prediction accuracy is not too much affected by using a subset of 3 metrics and the recall even improves.