Pattern Recognition with Fuzzy Objective Function Algorithms
Pattern Recognition with Fuzzy Objective Function Algorithms
Elements of Software Science (Operating and programming systems series)
Elements of Software Science (Operating and programming systems series)
Software Engineering: An Engineering Approach
Software Engineering: An Engineering Approach
A Metrics Suite for Object Oriented Design
IEEE Transactions on Software Engineering
Machine Learning
Towards a Software Change Classification System: A Rough Set Approach
Software Quality Control
An Application of Fuzzy Clustering to Software Quality Prediction
ASSET '00 Proceedings of the 3rd IEEE Symposium on Application-Specific Systems and Software Engineering Technology (ASSET'00)
On the extension of functional dependency degree from crisp to fuzzy partitions
Pattern Recognition Letters
IEEE Transactions on Software Engineering
A comparative study on heuristic algorithms for generating fuzzydecision trees
IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics
Refinement of generated fuzzy production rules by using a fuzzy neural network
IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics
Software defect prediction based on source code metrics time series
Transactions on rough sets XIII
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This paper is an extension of our earlier work in combining strengths of rough set theory and neuro-fuzzy decision trees in classifying software defect data. The extension includes the application of a rough-fuzzy classification trees to classifying defects. We compare classification results for five methods: rough sets, neuro-fuzzy decision trees, partial decision trees, rough-neuro-fuzzy decision trees and rough-fuzzy classification trees. The analysis of the results include a paired t-test for accuracy and number of rules. The results demonstrate that there is improvement in classification accuracy with the rough fuzzy classification trees with a minimal set of rules. The contribution of this paper is a comparative study of several hybrid approaches in classifying software defect data.