On the extension of functional dependency degree from crisp to fuzzy partitions

Authors:
Rajen B. Bhatt;M. Gopal
Affiliations:
Department of Electrical Engineering, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110 016, India;Department of Electrical Engineering, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110 016, India
Venue:
Pattern Recognition Letters
Year:
2006

Citing 4
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Abstract

This paper presents a novel approach to fingerprint alignment based on the optimization of cost functions. The optimization is performed in two stages: the first stage provides a robust initial registration based on non-minutiae features, and the second ...