Depth Estimation by Finding Best Focused Points Using Line Fitting

Authors:
Aamir Saeed Malik;Tae-Sun Choi
Affiliations:
Gwangju Institute of Science and Technology, Gwangju, Korea 500712;Gwangju Institute of Science and Technology, Gwangju, Korea 500712
Venue:
ICISP '08 Proceedings of the 3rd international conference on Image and Signal Processing
Year:
2008

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Abstract

This paper presents a method for depth estimation using image focus based on the linear regression model. For each pixel, we select two datasets based on the maximum value which is calculated using Laplacian operator. Then linear regression model is used to find lines that approximate these datasets. The best fit lines are found using least squares method. After approximating the two lines, their intersection point is calculated and weights are assigned to calculate the new value for the depth map. The proposed method is compared with four depth estimation algorithms.