Survey of Scanner and Printer Forensics at Purdue University

Authors:
Nitin Khanna;Aravind K. Mikkilineni;George T. Chiu;Jan P. Allebach;Edward J. Delp
Affiliations:
Purdue University, West Lafayette, USA IN 47907;Purdue University, West Lafayette, USA IN 47907;Purdue University, West Lafayette, USA IN 47907;Purdue University, West Lafayette, USA IN 47907;Purdue University, West Lafayette, USA IN 47907
Venue:
IWCF '08 Proceedings of the 2nd international workshop on Computational Forensics
Year:
2008

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Abstract

This paper describes methods for forensic characterization of scanners and printers. This is important in verifying the trust and authenticity of data and the device that created it. An overview of current forensic methods, along with current improvements of these methods is presented. Near-perfect identification of source scanner and printer is shown to be possible using these techniques.