A survey of forensic characterization methods for physical devices

Authors:
Nitin Khanna;Aravind K. Mikkilineni;Anthony F. Martone;Gazi N. Ali;George T. -C. Chiu;Jan P. Allebach;Edward J. Delp
Affiliations:
School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA;School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907, USA;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA;School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA
Venue:
Digital Investigation: The International Journal of Digital Forensics & Incident Response
Year:
2006

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Abstract

This paper describes methods for forensic characterization of physical devices. This is important in verifying the trust and authenticity of data and the device that created it. Current forensic identification techniques for digital cameras, printers, and RF devices are presented. It is also shown how these techniques can fit into a general forensic characterization framework, which can be generalized for use with other devices.