Empirical Analysis of the Relation between Level of Detail in UML Models and Defect Density

Authors:
Ariadi Nugroho;Bas Flaton;Michel R. Chaudron
Affiliations:
LIACS --- Leiden University, Leiden, The Netherlands 2333 CA;TU Eindhoven, Eindhoven, The Netherlands 5600 MB;LIACS --- Leiden University, Leiden, The Netherlands 2333 CA and TU Eindhoven, Eindhoven, The Netherlands 5600 MB
Venue:
MoDELS '08 Proceedings of the 11th international conference on Model Driven Engineering Languages and Systems
Year:
2008

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Abstract

This paper investigates the relation between the level of detail (LoD) in UML models and defect density of the associated implementation. We propose LoD measures that are applicable to both class- and sequence diagrams. Based on empirical data from an industrial software project we have found that classes with higher LoD, calculated using sequence diagram LoD metrics, correlates with lower defect density. Overall, this paper discusses a novel and practical approach to measure LoD in UML models and describes its application to a significant industrial case study.