Defect type and its impact on the growth curve

  • Authors:
  • Ram Chillarege;Wei-Lun Kao;Richard G. Condit

  • Affiliations:
  • IBM Thomas J. Watson Research Center, Yorktown Heights, NY;IBM Thomas J. Watson Research Center, Yorktown Heights, NY;IBM Thomas J. Watson Research Center, Yorktown Heights, NY

  • Venue:
  • ICSE '91 Proceedings of the 13th international conference on Software engineering
  • Year:
  • 1991

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Abstract