In-process improvement through defect data interpretation

  • Authors:
  • I. Bhandari;M. J. Halliday;J. Chaar;R. Chillarege;K. Jones;J. S. Atkinson;C. Lepori-Costello;P. Y. Jasper;E. D. Tarver;C. C. Lewis;M. Yonezawa

  • Affiliations:
  • IBM T.J. Watson Research Center, Yorktown Heights, NY;IBM T.J. Watson Research Center, Yorktown Heights, NY;IBM T.J. Watson Research Center, Yorktown Heights, NY;IBM T.J. Watson Research Center, Yorktown Heights, NY;IBM Large Scale Computing Division, Poughkeepsie, NY;IBM Canada Development Lab., North York, Ont., Canada;IBM Santa Teresa Lab., San Jose, CA;IBM Networking Systems, Research Triangle Park, NC;IBM Mid-Hudson Valley Programming Lab., Poughkeepsie, NY;IBM San Jose, San Jose, CA;IBM Japan, Ltd., Yamato Lab., Japan

  • Venue:
  • IBM Systems Journal
  • Year:
  • 1994

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Abstract