Defect-Based Reliability Analysis for Mission-Critical Software

Authors:
Raymond A. Paul;Farokh Bastani;I-Ling Yen;Venkata U. B. Challagulla
Affiliations:
-;-;-;-
Venue:
COMPSAC '00 24th International Computer Software and Applications Conference
Year:
2000

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Abstract

Most software reliability methods have been developed to predict the reliability of a program using only data gathered during the testing and validation of a specific program. Hence, the confidence that can be attained in the reliability estimate is limited since practical resource constraints can result in a statistically small sample set. One exception is the Orthogonal Defect Classification (ODC) method, which uses data gathered from several projects to track the reliability of a new program. Combining ODC with root-cause analysis can be useful in many applications where it is important to know the reliability of a program for a specific type of a fault. By focusing on specific classes of defects, it becomes possible to (a) construct a detailed model of the defect and (b) use data from a large number of programs. In this paper, we develop one such approach and demonstrate its application to modeling Y2K defects.