Using Neural Networks in Reliability Prediction

• Authors: Nachimuthu Karunanithi;Darrell Whitley;Yashwant K. Malaiya
• Venue: IEEE Software
• Year: 1992

It is shown that neural network reliability growth models have a significant advantage over analytic models in that they require only failure history as input and not assumptions about either the development environment or external parameters. Using the failure history, the neural-network model automatically develops its own internal model of the failure process and predicts future failures. Because it adjusts model complexity to match the complexity of the failure history, it can be more accurate than some commonly used analytic models. Results with actual testing and debugging data which suggest that neural-network models are better at endpoint predictions than analytic models are presented.