Software reliability: measurement, prediction, application (professional ed.)

  • Authors:
  • John D. Musa;Anthony Iannino;Kazuhira Okumoto

  • Affiliations:
  • AT&T Bell Labs, Whippany, NJ;AT&T Bell Labs, Whippany, NJ;AT&T Bell Labs, Whippany, NJ

  • Venue:
  • Software reliability: measurement, prediction, application (professional ed.)
  • Year:
  • 1989

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Abstract