Orthogonal Defect Classification-A Concept for In-Process Measurements
IEEE Transactions on Software Engineering - Special issue on software measurement principles, techniques, and environments
A taxonomy of computer program security flaws
ACM Computing Surveys (CSUR)
Defect type and its impact on the growth curve
ICSE '91 Proceedings of the 13th international conference on Software engineering
Classification and evaluation of defects in a project retrospective
Journal of Systems and Software
Software system defect content prediction from development process and product characteristics
Software system defect content prediction from development process and product characteristics
Leveraging User-Session Data to Support Web Application Testing
IEEE Transactions on Software Engineering
A software flaw taxonomy: aiming tools at security
SESS '05 Proceedings of the 2005 workshop on Software engineering for secure systems—building trustworthy applications
METRICS '05 Proceedings of the 11th IEEE International Software Metrics Symposium
Web error classification and analysis for reliability improvement
Journal of Systems and Software
Applying Concept Analysis to User-Session-Based Testing of Web Applications
IEEE Transactions on Software Engineering
Towards a unified fault-detection benchmark
Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
A decision support system for the classification of software coding faults: a research abstract
Proceedings of the 33rd International Conference on Software Engineering
Fully employing software inspections data
Innovations in Systems and Software Engineering
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This paper describes our experience in aggregating a number of historical datasets containing inspection defect data using different categorization schemes. Our goal was to make use of the historical data by creating models to guide future development projects. We describe our approach to reconciling the different choices used in the historical datasets to categorize defects, and the challenges we faced. We also present a set of recommendations for others involved in classifying defects.