Orthogonal Defect Classification-A Concept for In-Process Measurements
IEEE Transactions on Software Engineering - Special issue on software measurement principles, techniques, and environments
Testing object-oriented systems: models, patterns, and tools
Testing object-oriented systems: models, patterns, and tools
Information Retrieval
Inter-Class Mutation Operators for Java
ISSRE '02 Proceedings of the 13th International Symposium on Software Reliability Engineering
ISSRE '03 Proceedings of the 14th International Symposium on Software Reliability Engineering
MuJava: an automated class mutation system: Research Articles
Software Testing, Verification & Reliability
METRICS '05 Proceedings of the 11th IEEE International Software Metrics Symposium
Classifying Change Types for Qualifying Change Couplings
ICPC '06 Proceedings of the 14th IEEE International Conference on Program Comprehension
The class-level mutants of MuJava
Proceedings of the 2006 international workshop on Automation of software test
Research issues in software fault categorization
ACM SIGSOFT Software Engineering Notes
Extraction of bug localization benchmarks from history
Proceedings of the twenty-second IEEE/ACM international conference on Automated software engineering
Defect categorization: making use of a decade of widely varying historical data
Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement
Change Analysis with Evolizer and ChangeDistiller
IEEE Software
The WEKA data mining software: an update
ACM SIGKDD Explorations Newsletter
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A decision support system for fault classification is presented. The fault classification scheme is developed to provide guidance in process improvement and fault-based testing. The research integrates results in fault classification, source code analysis, and fault-based testing research. Initial results indicate that existing change type and fault classification schemes are insufficient for this purpose. Development of sufficient schemes and their evaluation are discussed.