Scalable Calculation of Logical Masking Effects for Selective Hardening Against Soft Errors

  • Authors:
  • Ilia Polian;Sudhakar M. Reddy;Bernd Becker

  • Affiliations:
  • -;-;-

  • Venue:
  • ISVLSI '08 Proceedings of the 2008 IEEE Computer Society Annual Symposium on VLSI
  • Year:
  • 2008

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Abstract

The field of embedded electronic systems is still emerging, e.g. in attractive products from widespreaded industry as well as in corresponding academic and industrial research activities. Here, multipurpose adaptivity and reliability features are playing ...